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Temperature dependence of apparent threshold voltage of silicon MOS transistors at cryogenic temperatures

✍ Scribed by Nathanson, H.C.; Jund, C.; Grosvalet, J.

Book ID: 114589317
Publisher: IEEE
Year: 1968
Tongue: English
Weight: 748 KB
Volume: 15
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1968.16191

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