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Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform

✍ Scribed by F. Bridou; J. Gautier; F. Delmotte; M.-F. Ravet; O. Durand; M. Modreanu

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 921 KB
Volume: 253
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.05.122

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