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Fourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures

✍ Scribed by O. Durand; N. Morizet


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
571 KB
Volume
253
Category
Article
ISSN
0169-4332

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