✦ LIBER ✦
A New Versatile Instrument for Characterization of Thin Films and Multilayers Using Spectroscopic Ellipsometry and Grazing X-Ray Reflectance
✍ Scribed by Boher, P. ;Stehle, J.L.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 396 KB
- Volume
- 170
- Category
- Article
- ISSN
- 0031-8965
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