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A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

✍ Scribed by Malte Behrens; Jan Tomforde; Enno May; Ragnar Kiebach; Wolfgang Bensch; Dietrich Häußler; Wolfgang Jäger

No coin nor oath required. For personal study only.

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