Detection of interfacial strain and phase separation in MBa2Cu3O7−x thin films using Raman spectroscopy and X-ray diffraction space mapping

✍ Scribed by K. Venkataraman; A.J. Kropf; C.U. Segre; Q.X. Jia; A. Goyal; B.W. Kang; S. Chattopadhyay; H. You; V.A. Maroni

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 702 KB
• Volume: 402
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2003.10.011