✦ LIBER ✦
Determination of residual strain by reflectivity, X-ray diffraction and Raman spectroscopy in ZnSe epilayers grown on GaAs (001), InP(001) and GaSb(001) by metal-organic vapor phase epitaxy
✍ Scribed by M. Stoehr; M. Maurin; F. Hamdani; J.P. Lascaray; D. Barbusse; B. Fraisse; R. Fourcade; P. Abraham; Y. Monteil
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 369 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0921-5107
No coin nor oath required. For personal study only.