๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Thin metal films in millimetre wave measurements

Publisher
Elsevier Science
Year
1962
Tongue
English
Weight
66 KB
Volume
12
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Spectroscopic ellipsometry measurements
Spectroscopic ellipsometry measurements of thin metal films
โœ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 151 KB ๐Ÿ‘ 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal