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Measurements of the intrinsic stress in thin metal films

โœ Scribed by R. Abermann


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
415 KB
Volume
41
Category
Article
ISSN
0042-207X

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Spectroscopic ellipsometry measurements
โœ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 151 KB ๐Ÿ‘ 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal