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Measurement of thermomigration in thin metal films

✍ Scribed by G.J. van Gurp; F.J. du Chatenier

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 578 KB
Volume: 131
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(85)90385-2

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