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Thickness uniformity check of electropolymerized thin films by means of small area XPS

✍ Scribed by Michel Delamar; Jacques-Emile Dubois

Publisher: Elsevier Science
Year: 1985
Weight: 238 KB
Volume: 184
Category: Article
ISSN: 0022-0728
DOI: 10.1016/0368-1874(85)85526-x

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