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Automatic measurement of thickness and uniformity of thin films by a computer aided device

✍ Scribed by Pierluigi Dellera; Ettore Gadioli; Paolo Guazzoni; Paolo Vergani; Luisa Zetta

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 491 KB
Volume: 334
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(93)90554-u

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