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Thickness dependence of intrinsic dielectric response and apparent interfacial capacitance in ferroelectric thin films

โœ Scribed by Pertsev, N. A.; Dittmann, R.; Plonka, R.; Waser, R.


Book ID
120320528
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
411 KB
Volume
101
Category
Article
ISSN
0021-8979

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