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Dielectric and ferroelectric response as a function of annealing temperature and film thickness of sol-gel deposited Pb(Zr0.52Ti0.48)O3 thin film

✍ Scribed by Cho, Chae-Ryong; Lee, Won-Jae; Yu, Byoung-Gon; Kim, Bo-Woo

No coin nor oath required. For personal study only.

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