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Thickness and Temperature Dependence of Dielectric Reliability Characteristics in Cerium Dioxide Thin Film

โœ Scribed by Fu-Chien Chiu


Book ID
114620149
Publisher
IEEE
Year
2010
Tongue
English
Weight
645 KB
Volume
57
Category
Article
ISSN
0018-9383

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UV-vis (acetonitrile) : k max (e) = 239 nm (85), 301 nm (28). 1 H NMR and 13 C NMR spectra in CDCl 3 . The mass spectrum and FTIR spectrum are same as those reported previously from our group [16a]. Detailed experimental methods and characterization data are available in the Supporting Information