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Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films

✍ Scribed by Reifenberg, John P. (author);Panzer, Matthew A. (author);Kim, Sangbum (author);Gibby, Aaron M. (author);Zhang, Yuan (author);Wong, Simon (author);Wong, H. S.Philip (author);Pop, Eric (author);Goodson, Kenneth E. (author)

Book ID: 120053678
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 468 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2784169

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