Thickness-dependence of stoichiometry and microstructure characteristics in correlation with conductivity type of CdTe films

✍ Scribed by A.A Ramadan; A Abd-El Mongy; I.S Ahmed Farag; A.M El-Shabiny; F.A Radwan; H.I Ismail; H.M Hashem

• Book ID: 108388520
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 164 KB
• Volume: 423
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/s0040-6090(02)01018-0