✦ LIBER ✦

Thickness dependence of the properties and thermal stability of PtSi films

✍ Scribed by S.R. Das; K. Sheergar; D.-X. Xu; A. Naem

Book ID: 107864512
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 581 KB
Volume: 253
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90368-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thickness dependence on the thermal stab

Thickness dependence on the thermal stability of silver thin films

✍ Kim, H. C.; Alford, T. L.; Allee, D. R. 📂 Article 📅 2002 🏛 American Institute of Physics 🌐 English ⚖ 380 KB

Thickness dependence of the structural a

Thickness dependence of the structural and electrical properties of ZnO thermal-evaporated thin films

✍ A GHADERI; S M ELAHI; S SOLAYMANI; M NASERI; M AHMADIRAD; S BAHRAMI; A E KHALILI 📂 Article 📅 2011 🏛 Springer-Verlag 🌐 English ⚖ 272 KB

Film thickness dependence on the electri

Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

✍ Yen-Tang Lyu; Ching-Ting Lee; Gwo-Ji Horng; Chia Ho; Ching-Yuan Lee; Chung-Sen W 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 239 KB

Thickness and stoichiometry dependence o

Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films

✍ Reifenberg, John P. (author);Panzer, Matthew A. (author);Kim, Sangbum (author);G 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 468 KB

Thickness and stoichiometry dependence o

Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films

✍ Reifenberg, John P. (author);Panzer, Matthew A. (author);Kim, Sangbum (author);G 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 468 KB

Dependence of PtSi Schottky diode electr

Dependence of PtSi Schottky diode electrical behaviour on the platinum film thickness and on the annealing process

✍ F. La Via; P. Lanza; O. Viscuso; G. Ferla; E. Rimini 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 432 KB