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Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

✍ Scribed by Yen-Tang Lyu; Ching-Ting Lee; Gwo-Ji Horng; Chia Ho; Ching-Yuan Lee; Chung-Sen Wu

No coin nor oath required. For personal study only.

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