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Thickness dependence of the amorphous-cubic and cubic-hexagonal phase transition temperatures of GeSbTe thin films on silicon nitride

✍ Scribed by H.K. Peng; K. Cil; A. Gokirmak; G. Bakan; Y. Zhu; C.S. Lai; C.H. Lam; H. Silva

No coin nor oath required. For personal study only.

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