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Thickness and dielectric constant determination of thin dielectric layers

โœ Scribed by Helene E. de Bruijn; Marcel Minor; Rob P.H. Kooyman; Jan Greve

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
392 KB
Volume
95
Category
Article
ISSN
0030-4018

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๐Ÿ“œ SIMILAR VOLUMES

Dielectric properties characterization o
Dielectric properties characterization of high dielectric constant thick films
โœ Luciene S. Demenicis; Josรฉ Ignacio Marulanda; Rodolfo A. A. Lima; Maria Cristina ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 717 KB

## Abstract A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposited over the lines.Besides the simpli