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Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

✍ Scribed by Helene E. de Bruijn; Bert S.F. Altenburg; Rob P.H. Kooyman; Jan Greve

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 598 KB
Volume: 82
Category: Article
ISSN: 0030-4018
DOI: 10.1016/0030-4018(91)90353-f

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