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Dielectric properties characterization of high dielectric constant thick films

✍ Scribed by Luciene S. Demenicis; José Ignacio Marulanda; Rodolfo A. A. Lima; Maria Cristina R. Carvalho

Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
717 KB
Volume
52
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposited over the lines.Besides the simplicity, the technique allows the characterization of the films under similar conditions to those in which they will operate as compact devices in multilayered configurations. Time domain analysis and experimental results for 61‐micron thick Barium Titanate films have confirmed the relative dielectric constant and loss tangent values (respectively, 100 and 0.3) predicted by the frequency domain characterization proposed. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52:2339–2344, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25440

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## Abstract A coplanar waveguide linear resonator technique for the experimental characterization of the dielectric properties of films in the microwave frequency range at room temperature is proposed. The approach is simple to implement as it consists of a film with unknown high dielectric constan