✦ LIBER ✦

A CPW linear resonator method for the microwave characterization of high dielectric constant films

✍ Scribed by Luciene S. Demenicis; Rodolfo A. A. Lima; Luiz Fernando M. Conrado; Walter Margulis; Maria Cristina R. Carvalho

Publisher: John Wiley and Sons
Year: 2007
Tongue: English
Weight: 186 KB
Volume: 49
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.22176

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✦ Synopsis

Abstract

A coplanar waveguide linear resonator technique for the experimental characterization of the dielectric properties of films in the microwave frequency range at room temperature is proposed. The approach is simple to implement as it consists of a film with unknown high dielectric constant deposited over the resonator, printed on standard alumina substrate using conventional photolithography process. The technique is illustrated by the measurement of the dielectric constant and losses of various ceramic screen‐printed thick films: BaTiO~3~ (BTO), CaCu~3~Ti~4~O~12~ (CCTO), and a BTO(x)–CCTO(1 − x) composite with different concentrations (x = 0.2, 0.5, and 0.8). © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 521–524, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22176

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