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Dielectric constant characterization using a numerical method for the microstrip ring resonator

✍ Scribed by Xiangyi Fang; David Linton; Chris Walker; Brian Collins

Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
130 KB
Volume
41
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

A new method of dielectric‐constant measurement is developed. The dielectric constant ε~r~ of RF/microwave substrate is extracted by combining the microstrip ring resonator measurement with Ansoft HFSS electromagnetic simulation software. The developed method has two advantages: (i) characterization of dielectric constant versus multiple frequency points, and (ii) compatibility with electronics design automation (EDA) software tools. This characterization method can reduce the design cycle of microwave circuits and devices. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 14–17, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20031

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