The thermal conductivity of low-dielectric-constant (low-k) materials has been studied by a nano second thermoreflectance measurement system (Nano-TheMS). The Nano-TheMS, which utilizes thermoreflectance, can easily measure the thermal conductivity of thin film of nano-meter scale thickness. We have
โฆ LIBER โฆ
Thermoreflectance as a Tool for Thermal Conductivity Measurements
โ Scribed by F. Aymerich; G. Mula
- Publisher
- John Wiley and Sons
- Year
- 1971
- Tongue
- English
- Weight
- 134 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0370-1972
No coin nor oath required. For personal study only.
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