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Thermoreflectance measurements of transient temperature upon integrated circuits: application to thermal conductivity identification

✍ Scribed by T. Phan; S. Dilhairel; V. Quintard; W. Claeys; J.C. Batsale

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 692 KB
Volume: 29
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(97)00056-6

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