Application of computer-based thermography to thermal measurements of integrated circuits and power devices

✍ Scribed by M. Grecki; J. Pacholik; B. Wiecek; A. Napieralski

• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 772 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(96)00037-7

✦ Synopsis

This paper presents the possibilities and the main problems of thennography in VLSI circuits and power devices design and measurement. It is focused on emissivity correction, noise and other measuring difficulties. Advanced new methods of surveys with the use of thernlography are also presented. Combining infrared and video images gives the additional possibility of thennography applications. A new method of scan shortening allows the use of infrared cameras for the purpose of investigating short transient thermal states. The applications of linage processing algorithms like filtering and averaging in computercontrolled thermography systelnS are also discussed. ~" 1997 Elsevier Science Ltd. All rights reserved.