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Effect of ultrasonic stress on the sensitivity of silicon strain devices and application to acoustic power measurement

✍ Scribed by V.R. Singh; Awadhesh Prasad

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 456 KB
Volume: 28
Category: Article
ISSN: 0924-4247
DOI: 10.1016/0924-4247(91)80002-7

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