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Thermal stability and secondary breakdown in planar power MOSFET's

✍ Scribed by Yoshida, I.; Okabe, T.; Katsueda, M.; Ochi, S.; Nagata, M.


Book ID
114593339
Publisher
IEEE
Year
1980
Tongue
English
Weight
465 KB
Volume
27
Category
Article
ISSN
0018-9383

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