✦ LIBER ✦
Change of gm(f) and breakdown voltage induced by thermal annealing of surface states in power MESFETs
✍ Scribed by Canali, C.; Corti, E.; Gabrielli, B.; Magistrali, F.; Paccagnella, A.; Sangalli, M.; Tedesco, C.
- Book ID
- 114536556
- Publisher
- IEEE
- Year
- 1990
- Tongue
- English
- Weight
- 336 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.52456
No coin nor oath required. For personal study only.