Study of thermal effects and self-heating phenomena in planar power SOI MOS transistors

✍ Scribed by Yu. A. Chaplygin; E. A. Artamonova; A. Yu. Krasyukov; T. Yu. Krupkina

• Book ID: 111444195
• Publisher: Springer
• Year: 2008
• Tongue: English
• Weight: 197 KB
• Volume: 42
• Category: Article
• ISSN: 1063-7826
• DOI: 10.1134/s1063782608130150