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Thermal degradation of Au/Ni2Si/n-SiC ohmic contacts under different conditions

✍ Scribed by A.V. Kuchuk; M. Guziewicz; R. Ratajczak; M. Wzorek; V.P. Kladko; A. Piotrowska

Book ID: 108215622
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 624 KB
Volume: 165
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2008.12.011

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