✦ LIBER ✦
Thermal stability and contact degradation mechanisms of TaC ohmic contacts with W/WC overlayers to n-type 6H SiC
✍ Scribed by Jang, T.; Odekirk, B.; Madsen, L. D.; Porter, L. M.
- Book ID
- 111909929
- Publisher
- American Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 402 KB
- Volume
- 90
- Category
- Article
- ISSN
- 0021-8979
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