Comparative Study of the Current Transport Mechanisms in Ni2Si Ohmic Contacts on n- and p-Type Implanted 4H-SiC

✍ Scribed by Vivona, Marilena; Greco, Giuseppe; Di Franco, Salvatore; Giannazzo, Filippo; Roccaforte, Fabrizio; Frazzetto, Alessia; Rascunà, Simone; Zanetti, Edoardo; Guarnera, Alfio; Saggio, Mario

• Book ID: 124078528
• Publisher: Trans Tech Publications, Ltd.
• Year: 2014
• Tongue: English
• Weight: 380 KB
• Volume: 778-780
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.778-780.665