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Fabrication and characterization of pulse laser deposited Ni2Si Ohmic contacts on n-SiC for high power and high temperature device applications

✍ Scribed by Cole, M. W.; Joshi, P. C.; Ervin, M.

Book ID: 111909927
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 752 KB
Volume: 89
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1357777

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