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Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts to n-SiC for high temperature and pulsed power device applications

โœ Scribed by Cole, M. W.; Joshi, P. C.; Hubbard, C.; Demaree, J. D.; Ervin, M.


Book ID
111909930
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
533 KB
Volume
91
Category
Article
ISSN
0021-8979

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