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Thermal coupling in integrated circuits: application to thermal testing

✍ Scribed by Altet, J.; Rubio, A.; Schaub, E.; Dilhaire, S.; Claeys, W.

Book ID: 119775736
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 250 KB
Volume: 36
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.896232

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