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Thermal conductivity of PVD TiAlN films using pulsed photothermal reflectance technique

โœ Scribed by Xing-Zhao Ding; M. K. Samani; George Chen


Book ID
106022217
Publisher
Springer
Year
2010
Tongue
English
Weight
381 KB
Volume
101
Category
Article
ISSN
1432-0630

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Thermal conductivity measurements of syn
โœ A.N. Petrovsky; A.O. Salnick; D.O. Mukhin; B.V. Spitsyn ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 130 KB

The non-destructive and non-contact photothermal beam deflection method has been applied to thin synthetic diamond films to give thermal conductivity measurements. The thickness of the diamond film was 12-50 /zm on silicon and tungsten substrates. The maximum film thermal conductivity value obtained