Thermal conductivity measurements of synthetic diamond films using the photothermal beam deflection technique

✍ Scribed by A.N. Petrovsky; A.O. Salnick; D.O. Mukhin; B.V. Spitsyn

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 130 KB
• Volume: 11
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/0921-5107(92)90239-6

✦ Synopsis

The non-destructive and non-contact photothermal beam deflection method has been applied to thin synthetic diamond films to give thermal conductivity measurements. The thickness of the diamond film was 12-50 /zm on silicon and tungsten substrates. The maximum film thermal conductivity value obtained was 850 W m-~ K-~ and this value is in reasonable agreement with those predicted theoretically.