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Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methods

✍ Scribed by Wu, Z. L. ;Reichling, M. ;Hu, X.-Q. ;Balasubramanian, K. ;Guenther, K. H.

Book ID
115343018
Publisher
The Optical Society
Year
1993
Tongue
English
Weight
1015 KB
Volume
32
Category
Article
ISSN
1559-128X

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An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under