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Modulated photothermal reflectance technique for measuring thermal conductivity of nano film on substrate and thermal boundary resistance

✍ Scribed by W.F. Bu; D.W. Tang; Z.L. Wang; X.H. Zheng; G.H. Cheng

Book ID: 108290077
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 330 KB
Volume: 516
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2008.04.037

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