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Development of a Frequency-Domain Method Using Completely Optical Techniques for Measuring the Interfacial Thermal Resistance between the Metal Film and the Substrate

โœ Scribed by Kato, Ryozo; Xu, Yibin; Goto, Masahiro


Book ID
111954443
Publisher
Institute of Pure and Applied Physics
Year
2011
Tongue
English
Weight
375 KB
Volume
50
Category
Article
ISSN
0021-4922

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