โฆ LIBER โฆ
Development of a Frequency-Domain Method Using Completely Optical Techniques for Measuring the Interfacial Thermal Resistance between the Metal Film and the Substrate
โ Scribed by Kato, Ryozo; Xu, Yibin; Goto, Masahiro
- Book ID
- 111954443
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2011
- Tongue
- English
- Weight
- 375 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0021-4922
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