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The use of low frequency capacitance to measure the thickness of natural oxide layers on aluminium

✍ Scribed by P.J. Holmes

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 275 KB
Volume: 7
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(64)90109-1

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