The use of low frequency capacitance to measure the thickness of natural oxide layers of aluminium: (Great Britain)P J Holmes, Solid State Electronics, 7 Aug 1964, 633–635

• Publisher: Elsevier Science
• Year: 1965
• Tongue: English
• Weight: 133 KB
• Volume: 15
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(65)90633-0