Nature of an oxide layer thermally grown on silicon and determination of its thickness, both from the infra-red properties

✍ Scribed by M. Miler

• Publisher: Elsevier Science
• Year: 1968
• Tongue: English
• Weight: 419 KB
• Volume: 11
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(68)90019-1