Nature of an oxide layer thermally grown on silicon and determination of its thickness, both from the infra-red properties : M. Miler, Solid-St. Electron.11 (1968), p. 391

• Publisher: Elsevier Science
• Year: 1968
• Tongue: English
• Weight: 98 KB
• Volume: 7
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(68)90142-x