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The study of in situ scanning tunnelling microscope characterization on GaN thin film grown by plasma assisted molecular beam epitaxy

✍ Scribed by Yang, R.; Krzyzewski, T.; Jones, T.

Book ID: 120037194
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 867 KB
Volume: 102
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4795790

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