๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The structure of amorphous silicon nitride films

โœ Scribed by M. V. Coleman; D. J. D. Thomas


Publisher
John Wiley and Sons
Year
1968
Tongue
English
Weight
557 KB
Volume
25
Category
Article
ISSN
0370-1972

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


The Structure of Amorphous Silicon Films
โœ M. V. Coleman; D. J. D. Thomas ๐Ÿ“‚ Article ๐Ÿ“… 1967 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 244 KB
Effects of deposition temperature on the
โœ M. Therasse; M. Benlahsen ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 134 KB

Amorphous carbon nitride films (a-CN x ) were deposited on Si(100) under different rf power and at different substrate temperature T S using rf magnetron sputtering of a high-purity graphite target in pure nitrogen. IR absorption, Raman spectra, and residual stress measurements are used to character