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The Role of Silicon Interstitials in the Formation of Boron-Oxygen Defects in Crystalline Silicon

✍ Scribed by Macdonald, Daniel; Deenapanray, Prakash N.K.; Cuevas, Andres; Diez, S.; Glunz, Stephan W.


Book ID
121853041
Publisher
Trans Tech Publications, Ltd.
Year
2005
Tongue
English
Weight
286 KB
Volume
108-109
Category
Article
ISSN
1662-9779

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